Hatina GP
THE GENERAL PURPOSE ATE FOR ASIC, PMIC and Smart Power
empowered by:
Kronos is a Software Toolset, which generates better and faster Test Programs, through automatic translation of natural language test descriptions to code
The HATINA GP is designed for testing complex Smart Power ICs and SoC. Recommended for high parallelism.
Highlights
- Suitable for wafer test and final test
- Multiplexer to increase productivity
- Low weight and dimensions
- Capable to test incredibly complex devices
- Revolutionary SW tools (Kronos)
- Up to 10 Slots with flexible configuration
Key Features:
- DC [IV quadrants Ground Referred] Sources Low Power: up to 160 resources per slot [±110V, ±200mA]
- DC [IV quadrants Ground Referred] Sources Medium Power: up to 80 resources per slot [±110V, ±4A]
- DC [IV quadrants Fully Floating] Sources High Power: up to 16 resources per slot [±80V, ±10A]
- Digital Channels: up to 256 channels per slot [-1,25V to 6,75V output level, 50mA, active Load ±12mA]
- Digital Channel LF II°Gen @200MHz up to 1024
- DPS HC [Digital Power Supply – High Current] 5.5V@10A up to 80
- DPS LC [Digital Power Supply – Low Current] 7V@1A up to 256
- Digital Channel HF @800MHz up to 256
- Time Measurement Unit & Differential Meter, AWG & Digitizer
- OPTION: -HV option
- Time Measurement Unit up to 64
- Floating Digital Driver up to 192
- LCR Meters: up to 64
- PPMU: up to 64
- Pico Meters: up to 64 [20pA as accuracy]
- Inductive & Resistive Loads up to 64 x 2
Dimensions
Height:
700 mm
Width:
670 mm
Depth:
640 mm
ATE
portfolio Download
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