Hatina 4S

VERY COMPACT SOLUTION FOR MEMS DEVICES TESTING

Flexible, low cost ATE, for very high parallel, low complexity markets like MEMS, open/shorts and consumer logic.

Very compact solution for MEMS device testing.

Increase production throughput and reduce costs because it allows the qualification of different types of devices without changing interface board.

Hatina platform is able to drive and produce different stimuli, and perform devices testing, both at wafer level and final test.
Hatina 4S can be adapted to all major handlers, where stimuli are already available.


Different configurations for different types of test
Highlights
  • High pin count V/I and DPS
  • High pin count digital
  • Integrated mux for extreme flexibility
  • 0-footprint, Low Cost per site
  • Easy automation integration
Key Features:
  • 2 DCS_1A ( force and sense ) sources multiplexed in 256 different positions per module
  • 12 Digital Channels multiplexed in 256 different positions per module
  • 20 direct digital channels per module

Dimensions

Height: 538 mm
Width: 360 mm
Depth: 330 mm
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