AUTOMATIC TEST EQUIPMENT
Hatina GP
Best COT for Automotive devices
Hatina 4S
High parallel test MEMS solution
VIP Extended
48 x site Si, SiC and GaN ATE solution
DMT – Digital Mix Signal Tester
Compact, mixed signal ATE for lab and engineering
Ovenless Burn-In & HTOL solution
Better ROI enabled via ovenless burn-in technology
Test Services
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ASIC design & Special Applications
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MARKET FOCUS
We are able to provide high performance and ultra-high parallelism test solutions to meet the ever- increasing testing need of mixed signals complex automotive, industrial and MEMS devices.
